DocumentCode
2685416
Title
Characterisation of reliability of compound semiconductor devices using electrical pulses
Author
Brandt, M. ; Krozer, V. ; Schobler, M. ; Bock, K.H. ; Hartnagel, H.L.
Author_Institution
Inst. fur Hochfrequenztechnik
fYear
1996
fDate
1996
Firstpage
1891
Lastpage
1894
Keywords
Noise measurement; Pulse measurements; Radio frequency; Semiconductor device noise; Semiconductor device reliability; Semiconductor devices; Space vector pulse width modulation; Stress; Temperature; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Print_ISBN
0-7803-3369-1
Type
conf
DOI
10.1109/ESREF.1996.888239
Filename
888239
Link To Document