DocumentCode :
2685416
Title :
Characterisation of reliability of compound semiconductor devices using electrical pulses
Author :
Brandt, M. ; Krozer, V. ; Schobler, M. ; Bock, K.H. ; Hartnagel, H.L.
Author_Institution :
Inst. fur Hochfrequenztechnik
fYear :
1996
fDate :
1996
Firstpage :
1891
Lastpage :
1894
Keywords :
Noise measurement; Pulse measurements; Radio frequency; Semiconductor device noise; Semiconductor device reliability; Semiconductor devices; Space vector pulse width modulation; Stress; Temperature; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Print_ISBN :
0-7803-3369-1
Type :
conf
DOI :
10.1109/ESREF.1996.888239
Filename :
888239
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2685416
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