DocumentCode
2685442
Title
Development of micro/nano displacement sensor for piezoelectric actuator
Author
Yu, Yong ; Song, Bo ; Ge, Yunjian
Author_Institution
Dept. of Mech. Eng., Kagoshima Univ., Kagoshima, Japan
fYear
2009
fDate
10-15 Oct. 2009
Firstpage
3290
Lastpage
3296
Abstract
Micro displacement measurement of the PZT actuator is a micro sensor which could measure the minute displacement in micron or nanometer level. In general, the sensor is required to accommodate little space in order to save the room of measuring device. In this paper, a mechanical micro displacement sensor with smaller volume has been proposed. This paper focus on the whole process of this novel sensor from the working principle, parameter determine to the FEM simulation as well as the characteristic experiment and so on. This sensor can enlarge the displacement of the PZT by utilizing the lever principle and the strain gauges can perceive the variation without amplifying the noise. In this sensor, we use the flexure hinges as the rotation joints to obtain the expansion. Whatever the simulation results in FEM or the experiment data, both of which show that the sensor can perceive the displacement of the PZT actuator in micro/nano scale. Also, the characteristic experiment shows that the proposed sensor has a higher level linearity, resolution and lower error.
Keywords
displacement measurement; finite element analysis; microsensors; nanosensors; piezoelectric actuators; FEM simulation; mechanical micro displacement sensor; micro displacement measurement; nano displacement sensor; piezoelectric actuator; Atomic force microscopy; Capacitive sensors; Displacement measurement; Fasteners; Intelligent sensors; Mechanical sensors; Piezoelectric actuators; Sensor phenomena and characterization; Sensor systems; Strain measurement; Displacement expansion; Flexure hinges; Micro/nano displacement sensor; Strain gauges;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligent Robots and Systems, 2009. IROS 2009. IEEE/RSJ International Conference on
Conference_Location
St. Louis, MO
Print_ISBN
978-1-4244-3803-7
Electronic_ISBN
978-1-4244-3804-4
Type
conf
DOI
10.1109/IROS.2009.5354460
Filename
5354460
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