DocumentCode
2685535
Title
Reliability and degradation behaviors of semi-insulating fe-doped InP buried hetero structure lasers fabricated by MOVPE and dry etching technique
Author
Mawatari, Hiroyasu ; Fukuda, Mitsuo ; Matsumoto, Shin-ichi ; Kishi, Kotaro ; Itaya, Yoshio
Author_Institution
NTT Opto-electronics Laboratories
fYear
1996
fDate
1996
Firstpage
1915
Lastpage
1918
Keywords
Aging; Chemical lasers; Degradation; Epitaxial growth; Epitaxial layers; Etching; Indium phosphide; Laser stability; Laser theory; Quantum well lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Print_ISBN
0-7803-3369-1
Type
conf
DOI
10.1109/ESREF.1996.888245
Filename
888245
Link To Document