Title :
A luminance inspector used for in-line backlight module quality assurance
Author :
Lin, Wu-Ja ; Ho, Chih-Wei ; Chiang, Donyau
Author_Institution :
Dept. of Comput. Sci. & Inform. Eng., Nat. Formosa Univ., Yunlin County, Taiwan
Abstract :
In this paper, we propose a luminance inspector which uses a CCD camera and neural network models to inspect multiple backlight modules at once. The proposed inspector can display the results at predetermined checked points in real time which is important for in-line quality check. The proposed inspector is more efficient compared to the traditional inspector which examines checked points one by one. Experiments show that the proposed inspector yields satisfactory results.
Keywords :
CCD image sensors; electrical engineering computing; inspection; neural nets; quality assurance; CCD camera; inline backlight module quality assurance; luminance inspector; neural network models; Brightness; Cathode ray tubes; Charge coupled devices; Computer displays; Instruments; Light emitting diodes; Light sources; Liquid crystal displays; Neural networks; Quality assurance; back light module; inspector; luminance; small form factor device;
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-2832-8
Electronic_ISBN :
1091-5281
DOI :
10.1109/IMTC.2010.5488000