Title :
On Unified Delay Fault Testing
Author :
Pramanick, Ankan K. ; Reddy, Sudhakar M.
Author_Institution :
IBM Corporation
Keywords :
Circuit faults; Circuit testing; Delay effects; Delay estimation; Electrical fault detection; Fault detection; Hardware; Logic testing; Robustness; System testing;
Conference_Titel :
VLSI Design, 1993. Proceedings. The Sixth International Conference on
Print_ISBN :
0-8186-3180-5
DOI :
10.1109/ICVD.1993.669694
