Title :
The use of fluorescence confocal microscopy in mapping Cr+3 profile within the YAG crystal fiber
Author :
Chen, Jian-Cheng ; Lo, Chia-Yao ; Huang, ShengIang ; Kao, FwJen
Author_Institution :
Inst. of Electro-Opt. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
Abstract :
We have demonstrated the use of fluorescence confocal microscopy in mapping the Cr+3 profile within the YAG crystal fiber. A sensitivity of 2.3×1016/cm3 was achieved, which is ten-fold of magnitude better than that of electron probe micro -analysis.
Keywords :
chromium; doping profiles; fluorescence; garnets; impurity distribution; optical materials; optical microscopy; yttrium compounds; Cr+3 profile mapping; YAG crystal fiber; YAG:Cr; YAl5O12:Cr; fluorescence confocal microscopy; Chromium; Electrons; Fiber lasers; Fluorescence; Microscopy; Optical fiber communication; Optical fiber devices; Optical fibers; Optical reflection; Probes;
Conference_Titel :
Lasers and Electro-Optics, 2003. CLEO/Pacific Rim 2003. The 5th Pacific Rim Conference on
Print_ISBN :
0-7803-7766-4
DOI :
10.1109/CLEOPR.2003.1277290