Abstract :
The author index contains an entry for each author and coauthor included in the proceedings record.
Conference_Titel :
Reliability of Electron Devices, Failure Physics and Analysis, 1996. Proceedings of the 7th European Symposium on
Conference_Location :
Enschede, The Netherlands
Print_ISBN :
0-7803-3369-1
DOI :
10.1109/ESREF.1996.888253
