• DocumentCode
    2685648
  • Title

    Experimental implementation of test method for dynamic characterization of DAC based on over sampling and low resolution ADC

  • Author

    Baccigalupi, A. ; Liccardo, A. ; Carnì, D.L. ; Grimaldi, D.

  • Author_Institution
    Dept. of Inf. Eng., Univ. of Naples Federico II, Naples, Italy
  • fYear
    2010
  • fDate
    3-6 May 2010
  • Firstpage
    142
  • Lastpage
    146
  • Abstract
    The paper deals with the experimental implementation of a test method to perform the dynamic characterization of the Digital to Analog Converter (DAC). This test method is based on the experimental detection of the Zero Crossing Time Sequence (ZCTS) into the resulting signal difference between the DAC output and the auxiliary reference one. From the ZCTS the numerical procedure reconstructs in the time domain and analyzes in the frequency domain the non-uniformly sampled output signal of the DAC. Advantageous aspect for the experimental implementation is the fact that the ZCTS can be detected by high speed low resolution ADC. The paper is focused on the experimental set up of the measurement station, the solutions to obtain the reference signal and the requirements to acquire the resulting signal with the proper resolution in order to detect the ZCTS. The results of the experimental tests carried out on the output section of 12 bit waveform generator are presented.
  • Keywords
    circuit testing; digital-analogue conversion; waveform generators; DAC; digital-analog converter; dynamic characterization; over sampling; test method; waveform generator; zero crossing time sequence; Digital-analog conversion; Frequency; Linearity; Performance evaluation; Sampling methods; Signal generators; Signal resolution; System testing; Time domain analysis; Voltage; DAC dynamic characterization; differential amplifier; spectral analysis; zero crossing time sequence;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    1091-5281
  • Print_ISBN
    978-1-4244-2832-8
  • Electronic_ISBN
    1091-5281
  • Type

    conf

  • DOI
    10.1109/IMTC.2010.5488006
  • Filename
    5488006