Title :
A Path Delay Fault Simulator for Sequential Circuits
Author :
Bose, Soumitra ; Agrawal, Prathima ; Agrawal, Vishwani D.
Author_Institution :
AT&T Bell Laboratories
Keywords :
Algebra; Circuit faults; Circuit simulation; Circuit testing; Clocks; Delay effects; Flip-flops; Propagation delay; Robustness; Sequential circuits;
Conference_Titel :
VLSI Design, 1993. Proceedings. The Sixth International Conference on
Print_ISBN :
0-8186-3180-5
DOI :
10.1109/ICVD.1993.669695
