Title :
Accelerated test as a tool for reliability comparison of systems manufactured by different ways
Author :
Vintr, Zdenek ; Valis, David
Author_Institution :
Fac. of Mil. Technol., Univ. of Defence, Brno, Czech Republic
Abstract :
The paper deals with a highly reliable electronic item containing a flash memory that is programmed during the manufacturing process. Non-intentional causes resulted in non-compliance of programming process with the prescribed manufacturing process. The non-compliance was detected only by accident and that was after some time. However, most of the items manufactured this way have been installed in systems and they have been in operation. A serious problem is the fact that an item potential failure can result in an accident with serious consequences. For this reason it was decided to verify if the errors during manufacturing process have an effect on item reliability. It was also decided to check influence of the manufacturing error using an accelerated test. The article describes the test methodology, practical realization of the test and evaluation of test results.
Keywords :
electronic products; electronics industry; flash memories; life testing; reliability; accelerated test; electronic item; flash memory; item potential failure; item reliability; manufacturing process; systems reliability comparison; Acceleration; Life estimation; Mathematical model; Reliability; Switches; Temperature; Vehicles; Reliability; accelerated test; electronic item; flash memory;
Conference_Titel :
Reliability, Maintainability and Safety (ICRMS), 2011 9th International Conference on
Conference_Location :
Guiyang
Print_ISBN :
978-1-61284-667-5
DOI :
10.1109/ICRMS.2011.5979444