Title :
The Influence of Metallization Thickness and Mounting Grooves on the Characteristics of Finlines
Author :
Vahldieck, R. ; Hoefer, W.J.R.
Abstract :
The influence of metallization thickness and mounting grooves in unilateral and bilateral fin-lines is investigated with a fully hybrid mode analysis. The effect of these parameters on both the dominant mode propagation and the operating bandwidth can be significant and must be considered for accurate design.
Keywords :
Cutoff frequency; Dielectric constant; Dielectric substrates; Finline; Metallization; Permittivity; Propagation constant; Strontium; Tellurium; Waveguide transitions;
Conference_Titel :
Microwave Symposium Digest, 1985 IEEE MTT-S International
Conference_Location :
St. Louis, MO, USA
DOI :
10.1109/MWSYM.1985.1131923
