• DocumentCode
    2685882
  • Title

    The Influence of Metallization Thickness and Mounting Grooves on the Characteristics of Finlines

  • Author

    Vahldieck, R. ; Hoefer, W.J.R.

  • fYear
    1985
  • fDate
    4-6 June 1985
  • Firstpage
    143
  • Lastpage
    144
  • Abstract
    The influence of metallization thickness and mounting grooves in unilateral and bilateral fin-lines is investigated with a fully hybrid mode analysis. The effect of these parameters on both the dominant mode propagation and the operating bandwidth can be significant and must be considered for accurate design.
  • Keywords
    Cutoff frequency; Dielectric constant; Dielectric substrates; Finline; Metallization; Permittivity; Propagation constant; Strontium; Tellurium; Waveguide transitions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1985 IEEE MTT-S International
  • Conference_Location
    St. Louis, MO, USA
  • ISSN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.1985.1131923
  • Filename
    1131923