• DocumentCode
    2685949
  • Title

    Synthesis of Sequential Circuits for Robust Path Delay Fault Testability

  • Author

    Bhatia, Sandeep ; Jha, Niraj K.

  • Author_Institution
    Princeton University
  • fYear
    1993
  • fDate
    3-6 Jan 1993
  • Firstpage
    275
  • Lastpage
    280
  • Keywords
    Circuit faults; Circuit synthesis; Circuit testing; Combinational circuits; Delay effects; Latches; Logic testing; Robustness; Sequential analysis; Sequential circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 1993. Proceedings. The Sixth International Conference on
  • ISSN
    1063-9667
  • Print_ISBN
    0-8186-3180-5
  • Type

    conf

  • DOI
    10.1109/ICVD.1993.669696
  • Filename
    669696
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2685949