• DocumentCode
    2686003
  • Title

    Dynamic bending tests and numerical simulation of board level electronic package

  • Author

    Fei, Qin ; Yngve, Wang ; Bin, Liu ; Tong, An ; Ling, Jin

  • Author_Institution
    Coll. of Mech. Eng. & Appl. Electron. Technol., Beijing Univ. of Technol., Beijing
  • fYear
    2008
  • fDate
    28-31 July 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    4-point dynamic bending tests of board level electronic packages were carried out in order to investigate the reliability of solder joints. A high speed camera and the digital image correlation method were used to measure the deflection of the PCB board. A finite element model to simulate the test was built up and was validated by the test data. A parameter study was subsequently implemented. The results show that at certain value of PCB stiffness the peeling stress reaches its peak. The package installation angel has significant effect on the peeling stress of the solder joints.
  • Keywords
    bending; circuit reliability; circuit simulation; electronics packaging; finite element analysis; printed circuit testing; solders; 4-point dynamic bending tests; PCB board; board level electronic package; digital image correlation method; finite element model; high-speed camera; package installation angel; peeling stress; solder joints; stiffness; Correlation; Digital cameras; Digital images; Electronic equipment testing; Electronics packaging; Finite element methods; Numerical simulation; Soldering; Stress; Velocity measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology & High Density Packaging, 2008. ICEPT-HDP 2008. International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-2739-0
  • Electronic_ISBN
    978-1-4244-2740-6
  • Type

    conf

  • DOI
    10.1109/ICEPT.2008.4606969
  • Filename
    4606969