DocumentCode
2686006
Title
Performance verification of instruments adopted for voltage dip measurement
Author
Gallo, Daniele ; Landi, Carmine ; Luiso, Mario
Author_Institution
Dipt. di Ing. dell´´Inf., Seconda Univ. di Napoli, Aversa, Italy
fYear
2010
fDate
3-6 May 2010
Firstpage
470
Lastpage
475
Abstract
The Voltage magnitude reductions (dips or sags) are one of power quality issues with the greater economical impact. For this reason, often, supply sites are characterized by dip measurement campaign in order to asses the presence and the severity level of this kind of phenomena. This measurement results are important parameters for selecting equipment with proper intrinsic immunity. However, instruments devoted to dip measurement still present unresolved technical and theoretical issues related to the performance characterization. After a description of algorithms used for detection of voltage dips in agreement with standards, this paper presents, in simplified conditions, the systematic deviations that these approaches involve in event characterization. The obtained results are used during the experimental verification of the measurement accuracy of a commercial power quality instrument to asses its performance accounting the systematic deviations due to detection algorithm imposed by standard.
Keywords
equipment selection; measurement standards; power supply quality; power system measurement; voltage measurement; detection algorithm; equipment selection; event characterization; instrument performance verification; intrinsic immunity; power quality instrument; voltage dip measurement; voltage magnitude reductions; Detection algorithms; Event detection; Hysteresis; Instruments; Power generation economics; Power measurement; Power quality; Threshold voltage; Voltage fluctuations; Voltage measurement; Measurement Accuracy; Power Quality instrument; Sag; Voltage Dip; performance characterization;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE
Conference_Location
Austin, TX
ISSN
1091-5281
Print_ISBN
978-1-4244-2832-8
Electronic_ISBN
1091-5281
Type
conf
DOI
10.1109/IMTC.2010.5488025
Filename
5488025
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