Title :
Performance verification of instruments adopted for voltage dip measurement
Author :
Gallo, Daniele ; Landi, Carmine ; Luiso, Mario
Author_Institution :
Dipt. di Ing. dell´´Inf., Seconda Univ. di Napoli, Aversa, Italy
Abstract :
The Voltage magnitude reductions (dips or sags) are one of power quality issues with the greater economical impact. For this reason, often, supply sites are characterized by dip measurement campaign in order to asses the presence and the severity level of this kind of phenomena. This measurement results are important parameters for selecting equipment with proper intrinsic immunity. However, instruments devoted to dip measurement still present unresolved technical and theoretical issues related to the performance characterization. After a description of algorithms used for detection of voltage dips in agreement with standards, this paper presents, in simplified conditions, the systematic deviations that these approaches involve in event characterization. The obtained results are used during the experimental verification of the measurement accuracy of a commercial power quality instrument to asses its performance accounting the systematic deviations due to detection algorithm imposed by standard.
Keywords :
equipment selection; measurement standards; power supply quality; power system measurement; voltage measurement; detection algorithm; equipment selection; event characterization; instrument performance verification; intrinsic immunity; power quality instrument; voltage dip measurement; voltage magnitude reductions; Detection algorithms; Event detection; Hysteresis; Instruments; Power generation economics; Power measurement; Power quality; Threshold voltage; Voltage fluctuations; Voltage measurement; Measurement Accuracy; Power Quality instrument; Sag; Voltage Dip; performance characterization;
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-2832-8
Electronic_ISBN :
1091-5281
DOI :
10.1109/IMTC.2010.5488025