• DocumentCode
    2686039
  • Title

    Vibration tests on prototypes of ultrasound array transducer: Evaluation of soldering electrical performances

  • Author

    Catelani, Marcantonio ; Scarano, Valeria L. ; Bertocci, Francesco ; Singuaroli, Roberto

  • Author_Institution
    Dept. of Electron. & Telecommun., Univ. of Florence, Florence, Italy
  • fYear
    2010
  • fDate
    3-6 May 2010
  • Firstpage
    432
  • Lastpage
    436
  • Abstract
    Mechanical stresses, as vibrations, are the main common types of solicitation to which electronic equipment can be subjected during its useful life. For this reason drop or shock tests become important for such device; the use of a shaker system, able to produce sinusoidal and random vibrations, can simulate the operating conditions in a less expensive and faster way. In this paper the planning and implementation of vibration tests on prototypes of piezoelectric transducers is proposed. In fact the devices taken into consideration are subjected to an innovative soldering process in compliance to RoHS directive. In particular, silver conductive adhesive as soldering material is used and measurements of the electrical resistance are carried out in order to evaluate the resistance degree of the samples to mechanical stresses.
  • Keywords
    dynamic testing; piezoelectric transducers; soldering; stress analysis; ultrasonic transducer arrays; RoHS directive; electronic equipment; mechanical stresses; piezoelectric transducers; shaker system; shock tests; soldering electrical performances; ultrasound array transducer; vibration tests; Electric resistance; Performance evaluation; Prototypes; Soldering; Stress; Testing; Ultrasonic imaging; Ultrasonic transducer arrays; Ultrasonic transducers; Vibrations; conductive glue; lead free; piezoelectric transducer; reliability characterization; silver conductive adhesive; solder joint; ultrasound array transducer; vibration test;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    1091-5281
  • Print_ISBN
    978-1-4244-2832-8
  • Electronic_ISBN
    1091-5281
  • Type

    conf

  • DOI
    10.1109/IMTC.2010.5488027
  • Filename
    5488027