DocumentCode
2686146
Title
Driving Realistic Texture in Simulated Long-Wave Infrared Imagery
Author
Ward, Jason T. ; Lach, Stephen R. ; Schott, John R. ; Sanders, Niek J. ; Brown, Scott D.
Author_Institution
Rochester Inst. of Technol., Rochester, NY
Volume
3
fYear
2008
fDate
7-11 July 2008
Abstract
The visually-realistic yet radiometrically-accurate simulation of long-wave infrared (LWIR) imagery is a problem that has plagued members of industry and academia alike. Simulating texture in LWIR imagery is a more complex task due to temperature variation which is a function of solar absorptivity, surface orientation, shadowing and bulk thermal properties. In order to deal with these additional sources of variability, we have improved the Digital Imaging and Remote Sensing Image Generation (DIRSIG) model to allow the use of thermal property texture maps to control various thermal properties. This paper presents these methods and applies them in order to simulate LWIR imagery taken over natural desert scenes in Trona, CA. The resulting imagery demonstrates that these new methodologies for modeling thermodynamic phenomena and the utilization of an enhanced DIRSIG tool improve the average root mean-squared error (RMSE) of our synthetic LWIR imagery by up to 88%.
Keywords
geophysical techniques; image texture; infrared imaging; land surface temperature; sunlight; California; DIRSIG model; Digital Imaging and Remote Sensing Image Generation; Trona; atmospheric temperature variation; bulk thermal properties; image texture simulation; long-wave infrared imagery; natural desert scenes; radiometrically-accurate simulation; root mean-squared error; shadowing properties; solar absorptivity; surface orientation; thermodynamic phenomena; Digital images; Image generation; Infrared imaging; Layout; Radiometry; Remote sensing; Shadow mapping; Surface texture; Temperature sensors; Thermodynamics; Infrared imaging; Modeling; Remote sensing; Simulation; Thermal variables measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Geoscience and Remote Sensing Symposium, 2008. IGARSS 2008. IEEE International
Conference_Location
Boston, MA
Print_ISBN
978-1-4244-2807-6
Electronic_ISBN
978-1-4244-2808-3
Type
conf
DOI
10.1109/IGARSS.2008.4779451
Filename
4779451
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