DocumentCode :
2686416
Title :
Vectorless transient power grid verification: A case study with IBM benchmarks
Author :
Xuanxing Xiong ; Jia Wang
Author_Institution :
Design Group, Synopsys, Inc., Mountain View, CA, USA
fYear :
2015
fDate :
15-21 March 2015
Firstpage :
271
Lastpage :
276
Abstract :
Vectorless power grid verification is a powerful method that evaluates the worst-case voltage noises without detailed current waveforms by using optimization techniques. It is extremely challenging when considering transient current excitations, because transient currents are difficult to model and multiple time steps should be evaluated after the discretization of the system equation. In this work, we propose to perform vectorless verification with transient constraints and power constraints defined per clock period (or per hyper-period of multiple clocks if the grid supports multiple clock domains), so that the worst-case voltage noises of each node at any time step can be computed by transient simulation and solving optimization problems. More importantly, we apply the proposed transient verification approach to build a vectorless verification flow for IBM power grid transient analysis benchmarks, and evaluate the accuracy and runtime performance of the proposed approach with different hierarchical constraint setups. Experimental results show that the avg./max. errors of the proposed approach can be within 6%/9% of VDD, and the runtime to solve the optimization problems can be comparable to (or even larger than) the transient simulation time.
Keywords :
optimisation; power grids; power system transients; IBM power grid transient analysis; optimization techniques; power constraints; transient constraints; transient current excitations; transient simulation; transient verification approach; vectorless transient power grid verification; vectorless verification flow; worst-case voltage noises; Clocks; Computational modeling; Integrated circuit modeling; Noise; Optimization; Power grids; Transient analysis; Power grid; current constraint; vectorless verification; voltage drop;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility and Signal Integrity, 2015 IEEE Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4799-1992-5
Type :
conf
DOI :
10.1109/EMCSI.2015.7107698
Filename :
7107698
Link To Document :
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