DocumentCode
2686416
Title
Vectorless transient power grid verification: A case study with IBM benchmarks
Author
Xuanxing Xiong ; Jia Wang
Author_Institution
Design Group, Synopsys, Inc., Mountain View, CA, USA
fYear
2015
fDate
15-21 March 2015
Firstpage
271
Lastpage
276
Abstract
Vectorless power grid verification is a powerful method that evaluates the worst-case voltage noises without detailed current waveforms by using optimization techniques. It is extremely challenging when considering transient current excitations, because transient currents are difficult to model and multiple time steps should be evaluated after the discretization of the system equation. In this work, we propose to perform vectorless verification with transient constraints and power constraints defined per clock period (or per hyper-period of multiple clocks if the grid supports multiple clock domains), so that the worst-case voltage noises of each node at any time step can be computed by transient simulation and solving optimization problems. More importantly, we apply the proposed transient verification approach to build a vectorless verification flow for IBM power grid transient analysis benchmarks, and evaluate the accuracy and runtime performance of the proposed approach with different hierarchical constraint setups. Experimental results show that the avg./max. errors of the proposed approach can be within 6%/9% of VDD, and the runtime to solve the optimization problems can be comparable to (or even larger than) the transient simulation time.
Keywords
optimisation; power grids; power system transients; IBM power grid transient analysis; optimization techniques; power constraints; transient constraints; transient current excitations; transient simulation; transient verification approach; vectorless transient power grid verification; vectorless verification flow; worst-case voltage noises; Clocks; Computational modeling; Integrated circuit modeling; Noise; Optimization; Power grids; Transient analysis; Power grid; current constraint; vectorless verification; voltage drop;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility and Signal Integrity, 2015 IEEE Symposium on
Conference_Location
Santa Clara, CA
Print_ISBN
978-1-4799-1992-5
Type
conf
DOI
10.1109/EMCSI.2015.7107698
Filename
7107698
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