• DocumentCode
    2686497
  • Title

    A model for predicting the obsolescence trend of FPGA

  • Author

    Gao, Cheng ; Liu, Xiaozhang ; Wang, Xiangfen

  • Author_Institution
    Sch. of Reliability & Syst. Eng., Beihang Univ., Beijing, China
  • fYear
    2011
  • fDate
    12-15 June 2011
  • Firstpage
    1354
  • Lastpage
    1358
  • Abstract
    Obsolescence makes equipments supporting and maintaining hard and costly. It hurts the equipments reliability seriously. In the past decades, electronic technology has developed very rapidly causing components (and particularly the FPGAs) to have a shortened life span. So the problem of electronic component obsolescence in complex electronic or long life systems such as aircraft submarines and ships is getting more and more severe, therefore has heighten the interest of researchers. This paper analyses the FPGA obsolescence drivers, on based of which it introduces some traditional methods to deal with obsolescence, and proposes a model to predict the obsolescence trend of FPGA. It can be a reference for system designers selecting FPGAs. For the purpose of verifying the model, XC4085 is used to be an example.
  • Keywords
    circuit reliability; field programmable gate arrays; FPGA; XC4085; obsolescence trend; reliability; Correlation; Field programmable gate arrays; Logic gates; Materials; Predictive models; Production; Reliability; Component; DMSMS; FPGA; Obsolescence;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability, Maintainability and Safety (ICRMS), 2011 9th International Conference on
  • Conference_Location
    Guiyang
  • Print_ISBN
    978-1-61284-667-5
  • Type

    conf

  • DOI
    10.1109/ICRMS.2011.5979481
  • Filename
    5979481