DocumentCode :
2686519
Title :
The design of the Ku band Dielectric Resonator Oscillator
Author :
Yan, Guoguang
Author_Institution :
Motorola R&D Center, Motorola Co., Hangzhou
fYear :
2008
fDate :
28-31 July 2008
Firstpage :
1
Lastpage :
3
Abstract :
Phase noise is considered as a significant source of performance degradation of irreducible error rate in millimeter-wave and microwave systems, in particular, for applications employing low cost and moderate bit rate systems. Many new ways to improve oscillator phase noise have been proposed. There was the new developments using dielectric resonators assembled on monolithic microwave integrated circuits. The paper provides a new approach to accurately simulate the Dielectric Resonator and design the GaAs MESFET dielectric resonator oscillator (DRO) in the 12.75 GHz by negative resistance theory and Harmonic Balance theory with use of two EDA (electronic design automation) tool (CST&ADS). Passive microwave & RF component design is traditionally seen as CSTpsilas core competence. The soft of CST will be used in accurately simulate the dielectric resonator. The soft of advanced design systerm of the Agilent will be used in the nolinerity analyses and optimization design of the DRO . After the EDA tool simulate and optimization, The unprecedented performance of DRO was found . At @12.75 GHz, output power exceed 13 dBm, Phase noise less -104 dBc.
Keywords :
III-V semiconductors; MESFET circuits; MMIC; dielectric resonator oscillators; gallium arsenide; microwave oscillators; phase noise; Agilent; GaAs; MESFET dielectric resonator oscillator; RF component design; electronic design automation tool; frequency 12.75 GHz; harmonic balance theory; microwave systems; millimeter-wave systems; monolithic microwave integrated circuits; negative resistance theory; passive microwave component design; phase noise; Assembly; Bit rate; Costs; Degradation; Dielectrics; Electronic design automation and methodology; Error analysis; Microwave oscillators; Millimeter wave integrated circuits; Phase noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology & High Density Packaging, 2008. ICEPT-HDP 2008. International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-2739-0
Electronic_ISBN :
978-1-4244-2740-6
Type :
conf
DOI :
10.1109/ICEPT.2008.4607000
Filename :
4607000
Link To Document :
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