DocumentCode :
2686651
Title :
All digital ADC with linearity correction and temperature compensation
Author :
Negreiros, Marcelo ; Carro, Luigi ; Cassel, Gustavo
Author_Institution :
Inst. de Inf., UFRGS, Porto Alegre, Brazil
fYear :
2010
fDate :
3-6 May 2010
Firstpage :
147
Lastpage :
152
Abstract :
While digital circuits benefit from high-density digital CMOS technology, the design of analog and mixed signal blocks in the same technology is a higher challenge at each new technology node. AD converters are an example of such blocks. A possible solution is the implementation of ADCs in digital technology using logic gates as a voltage controlled oscillator. However, the limited linearity and temperature sensitivity are known issues. In this paper, a linearity correction technique that is also able to compensate for temperature effects is used. Results indicate the feasibility of the approach.
Keywords :
analogue-digital conversion; compensation; logic gates; voltage-controlled oscillators; all digital ADC; linearity correction; logic gates; signal blocks; temperature compensation; voltage controlled oscillator; CMOS analog integrated circuits; CMOS digital integrated circuits; CMOS logic circuits; CMOS technology; Digital circuits; Linearity; Logic gates; Signal design; Temperature sensors; Voltage-controlled oscillators; VCO-based ADC; temperature compensation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE
Conference_Location :
Austin, TX
ISSN :
1091-5281
Print_ISBN :
978-1-4244-2832-8
Electronic_ISBN :
1091-5281
Type :
conf
DOI :
10.1109/IMTC.2010.5488059
Filename :
5488059
Link To Document :
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