Title :
Expert system for the development of ATE software
Author :
Chenoweth, D.L. ; Cassaro, M.J.
Author_Institution :
Louisville Univ., KY, USA
Abstract :
The authors explain the design and operation of an expert system used to develop test program sets for fault detection and isolation on circuit card assemblies. The expert system produces control software code and accompanying documentation for the testing programs that are used to control automated testing equipment.<>
Keywords :
CAD; automatic test equipment; printed circuit testing; software engineering; ATE software development; CAD; circuit card assemblies; expert system; fault detection; Assembly systems; Automatic control; Automatic testing; Circuit testing; Control systems; Electrical fault detection; Expert systems; Software systems; Software testing; System testing;
Conference_Titel :
System Theory, 1988., Proceedings of the Twentieth Southeastern Symposium on
Conference_Location :
Charlotte, NC, USA
Print_ISBN :
0-8186-0847-1
DOI :
10.1109/SSST.1988.17102
