• DocumentCode
    2686746
  • Title

    Design of a CMOS charge pump for high-performance phase-locked loop

  • Author

    Xiangguang Xuan ; Feng Ran ; Meihua Xu

  • Author_Institution
    Technol. Center, Shanghai FeiLe Ltd. Co., Shanghai
  • fYear
    2008
  • fDate
    28-31 July 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In conventional CMOS charge pump circuits, there are some current mismatching characteristics which result in a phase offset in phase-locked loop circuits. This paper presents a new charge pump circuit after detailed analysis of the current mismatch problem. It combines an error amplifier with reference current sources to achieve good current matching characteristics and lower phase noises, and at the same time it can eliminate charge sharing by using charge removal transistors. The circuit was designed by chartered 0.35 um CMOS technology and simulated by Spectre tools. Simulation results show that the good current matching characteristics can be obtained with the proposed designing scheme.
  • Keywords
    CMOS integrated circuits; integrated circuit design; integrated circuit modelling; integrated circuit noise; phase locked loops; phase noise; CMOS charge pump design; Spectre tools; charge removal transistors; current mismatch problem; error amplifier; high-performance phase-locked loop circuit; phase noise; phase offset; reference current sources; size 0.35 mum; CMOS technology; Charge pumps; Circuit simulation; Clocks; Microelectronics; Phase frequency detector; Phase locked loops; Radio access networks; Voltage control; Voltage-controlled oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology & High Density Packaging, 2008. ICEPT-HDP 2008. International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-2739-0
  • Electronic_ISBN
    978-1-4244-2740-6
  • Type

    conf

  • DOI
    10.1109/ICEPT.2008.4607016
  • Filename
    4607016