Title :
Toward a BITE for real time MTTF estimation of capacitors
Author :
Albertini, Andrea ; Masi, Maria Gabriella ; Mazzanti, Giovanni ; Peretto, Lorenzo ; Tinarelli, Roberto
Author_Institution :
Dept. of Electr. Eng., Univ. of Bologna, Bologna, Italy
Abstract :
The use of an equipment able to provide a real time diagnostic of a monitored device (BITE) allows to increase reliability and to decrease costs. BITE operates on the basis of a suitable life model of the considered device that must relate time to failure with past and present stresses. Model development can be carried out by exploiting the results of a proper measurement campaign. In this paper, a study of the life model for capacitor subjected to thermal stress is performed by presenting the test system and discussing the achieved results.
Keywords :
capacitors; computerised monitoring; electronic equipment testing; reliability; thermal stresses; BITE; capacitor; electronic equipment; real time MTTF estimation; real time diagnostic; thermal stress; Aging; Capacitors; Condition monitoring; Electronic equipment; Life testing; Performance evaluation; Preventive maintenance; Temperature; Thermal factors; Thermal stresses; Arrhenius model; capacitor; constant thermal stress; time-varying thermal stress;
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-2832-8
Electronic_ISBN :
1091-5281
DOI :
10.1109/IMTC.2010.5488065
