Title :
Metamodeling-rapid design and evolution of domain-specific modeling environments
Author :
Nordstrom, Greg ; Sztipanovits, Janos ; Karsai, Gabor ; Ledeczi, Akos
Author_Institution :
Inst. for Software Integrated Syst., Vanderbilt Univ., Nashville, TN, USA
Abstract :
Model integrated computing (MIC) is gaining increased attention as an effective and efficient method for developing, maintaining, and evolving large-scale, domain-specific software applications for computer-based systems. MIC is a model-based approach to software development, allowing the synthesis of application programs from models created using customized, domain-specific model integrated program synthesis (MIPS) environments. Until now, these MIPS environments have been handcrafted. Analysis has shown that it is possible to “model the modeling environment” by creating a metamodel that specifies both the syntactic and semantic behavior of the desired domain-specific MIPS environment (DSME). Such a metamodel could then be used to synthesize the DSME itself allowing the entire design environment to safely and efficiently evolve in the face of changing domain requirements. This paper discusses the use of the Unified Modeling Language and the Object Constraint Language to specify, such metamodels, and describes a method for incorporating these metamodels into the MultiGraph Architecture, a MIPS creation toolset
Keywords :
computer aided software engineering; software engineering; software tools; MIPS creation toolset; MultiGraph Architecture; Object Constraint Language; Unified Modeling Language; domain-specific software; model integrated computing; model integrated program synthesis; software development; Application software; Electrical capacitance tomography; Identity-based encryption; Metamodeling; Microwave integrated circuits; Software maintenance; Software systems; Tellurium; Tires; Unified modeling language;
Conference_Titel :
Engineering of Computer-Based Systems, 1999. Proceedings. ECBS '99. IEEE Conference and Workshop on
Conference_Location :
Nashville, TN
Print_ISBN :
0-7695-0028-5
DOI :
10.1109/ECBS.1999.755863