Title :
Study on no-fillet SMT solder joint reliability based on solder joint shape CAD
Author :
Zhaohua, Wu ; Dejian, Zhou ; Chunyue, Huang
Author_Institution :
Sch. of Mech. & Electrial Eng., Guilin Univ. of Electron. Technol., Guilin
Abstract :
Four process parameters including, the pad length, the pad width, the stencil thickness and the stand-off, are chosen as four control factors, and by using an L25(56) orthogonal array, the no-fillet chip component solder joints shapes with 25 different process parameters combinations are established. And then all the shape prediction models of the 25 solder joints are built through the Surface Evolver soft, after that, the finite element analysis models are set up by converting the above ones. Afterwards, a non-linear finite element analysis on the no-fillet chip component solder joints under thermal cycles are performed by using ANSYS soft, and the thermal fatigue lifes of them are achieved through Coffin-Manson equation. Finally the variance analysis was performed based on the above lifes figures. The research show that with 95% confidence the stand-off has a significant effect on the reliability of the no-fillet chip component solder joints, whereas the pad length, the pad width and the stencil thickness have little effects on the reliability of the ones.
Keywords :
CAD; finite element analysis; reliability; solders; surface mount technology; ANSYS soft; Coffin-Manson equation; SMT solder joint reliability; Surface Evolver soft; finite element analysis; pad length; pad width; process parameters; solder joint shape CAD; stand-off; stencil thickness; thermal fatigue; variance analysis; Analysis of variance; Fatigue; Finite element methods; Nonlinear equations; Performance analysis; Predictive models; Shape control; Soldering; Surface-mount technology; Thickness control; No-fillet; Process parameters; Reliability; Solder joint shape; Variance analysis;
Conference_Titel :
Electronic Packaging Technology & High Density Packaging, 2008. ICEPT-HDP 2008. International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-2739-0
Electronic_ISBN :
978-1-4244-2740-6
DOI :
10.1109/ICEPT.2008.4607023