Title :
ESD protection schemes and devices embedded in a 700V integrated power management platform
Author :
Kanawati, Roda ; Parvin, Avi ; Rotshtein, Israel ; Quon, David ; Yankelevich, Alfred ; Aloni, Efraim ; Eyal, Alon ; Shapira, Shye
Author_Institution :
TowerJazz, Migdal Haemek, Israel
Abstract :
This paper reviews RC and voltage triggered solutions for ESD protection of high voltage devices, embedded in TowerJazzes TS100PM 700V power management platform. The merits and limits of each solution are discussed with specific attention to the ESD design window. A scalable voltage PNP ESD protection device solution that has a trigger voltage range between 400V and 800V is presented.
Keywords :
electrostatic discharge; high voltage devices; integrated circuit power management; integrated power management platform; scalable voltage PNP ESD protection; voltage 700 V; Clamps; Couplings; Electrostatic discharges; Implants; Logic gates; Stress; Stress measurement; 700V. Offline AC DC; ESD; Power Management;
Conference_Titel :
Microwaves, Communications, Antennas and Electronics Systems (COMCAS), 2011 IEEE International Conference on
Conference_Location :
Tel Aviv
Print_ISBN :
978-1-4577-1692-8
DOI :
10.1109/COMCAS.2011.6105911
