Title :
GaN HEMT with scalable >2.2 kV breakdown voltage
Author :
Alpern, Yair ; Baksht, Tamara ; Bunin, Gregory ; Capua, Eyal ; Roiter, Yulia ; Rozman, David
Author_Institution :
VisIC Technol., Israel
Abstract :
AlGaN/GaN High Electron Mobility Transistors (HEMTs) are well recognized today as the best electron devices for power amplification in microwave frequency range for power transmitters and RADARs. GaN-based devices promise to have the best power performance not only in signal amplification area but also in huge area of power conversion. This paper describes what unique properties of GaN enable handling of high power levels at high frequencies, how GaN-based transistors empower new generation of power electronics and few key technologies and operation principles of GaN transistors for microwave and power electronics. The measurement results of AlGaN/GaN HEMTs without field plates with breakdown voltage higher than 2 kV are presented.
Keywords :
III-V semiconductors; aluminium compounds; gallium compounds; high electron mobility transistors; microwave field effect transistors; wide band gap semiconductors; AlGaN-GaN; HEMT; electron devices; high electron mobility transistors; power amplification; power conversion; power electronic generation; power transmitters; radar; scalable breakdown voltage; signal amplification area; Aluminum gallium nitride; Electric breakdown; Gallium nitride; HEMTs; Logic gates; Semiconductor device measurement; AlGaN/GaN HEMT; breakdown; power conversion;
Conference_Titel :
Microwaves, Communications, Antennas and Electronics Systems (COMCAS), 2011 IEEE International Conference on
Conference_Location :
Tel Aviv
Print_ISBN :
978-1-4577-1692-8
DOI :
10.1109/COMCAS.2011.6105935