DocumentCode
2687463
Title
Fundamental influence of segregated Bi on the mechanical properties of interconnect of bismuth-containing solder and copper
Author
Pang, Xue-Yong ; Liu, Zhi-Quan ; Wang, Shao-Qing ; Shang, Jian-Ku
Author_Institution
Shenyang Nat. Lab. for Mater. Sci., Chinese Acad. of Sci., Shenyang
fYear
2008
fDate
28-31 July 2008
Firstpage
1
Lastpage
3
Abstract
We employed density functional theory to investigate bismuth segregation at Cu/Cu3Sn interface. Firstly, we considered five initial constructions by adopting the adhesion energies criterion. By comparing adhesion energies of them, the so-called ldquoBetween-Curdquo construction was found to be the most energy-favored (0.98J/m2). Secondly, based on ldquoBetween-Curdquo construction, we introduced eight possible segregation sites. Among these eight sites, Site-2 was determined to be the most likely segregation site with adhesion energy as low as 0.53J/m2, which is almost half of the adhesion energy of the initial construction. Finally, we analyzed atomic structure and electronic density, from which it was found that the interfacial space was enlarged by bismuth segregation and the bond between the first layer and the second layer at copper side was weakened. Our calculated result is qualitatively consistent with reported experimental results and can explain them well.
Keywords
adhesion; copper; density functional theory; electron density; integrated circuit interconnections; segregation; solders; Cu-Cu3Sn; adhesion energies criterion; adhesion energy; atomic structure; bismuth-containing solder; copper; density functional theory; electronic density; interconnect; mechanical properties; segregation; segregation sites; Adhesives; Aging; Atomic layer deposition; Bismuth; Bonding; Copper alloys; Intermetallic; Lead; Materials science and technology; Mechanical factors;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology & High Density Packaging, 2008. ICEPT-HDP 2008. International Conference on
Conference_Location
Shanghai
Print_ISBN
978-1-4244-2739-0
Electronic_ISBN
978-1-4244-2740-6
Type
conf
DOI
10.1109/ICEPT.2008.4607064
Filename
4607064
Link To Document