• DocumentCode
    2687513
  • Title

    Latency & area measurement and optimization of asynchronous nanowire crossbar system

  • Author

    Wu, Jun ; Choi, Minsu

  • Author_Institution
    Dept of Electr. & Comput. Eng., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
  • fYear
    2010
  • fDate
    3-6 May 2010
  • Firstpage
    1596
  • Lastpage
    1601
  • Abstract
    In this work, a novel model-based latency/area measurement and optimization method for the newly proposed Asynchronous Nanowire Reconfigurable Crossbar Architecture (ANRCA) is presented and validated. ANRCA is based on a self-timed logic referred to as the Null Convention Logic (NCL). Since there is no global clocking and clock distribution network, all failure modes related to timing will be either eliminated or relaxed. The proposed architecture is anticipated to have higher manufacturability and robustness that are critical factors in nanoscale systems due to nondeterministic nature of nanoassembly. In order to facilitate efficient programming and flexible reconfiguration, a new hierarchical reconfigurable architecture for ANRCA is also proposed. Various configurable logic block structures have been considered and also their programming and reconfiguration issues are discussed. The proposed measurement and optimization method can be used to estimate area and latency measurements for different configurable logic blocks and also applied to find the optimal structure for the given arbitrary logic to map. As a case study, a full adder (i.e., combinational logic block) with input and output registrations (i.e., sequential elements) has been implemented on the proposed configurable logic block structures to validate the proposed measurement and optimization method.
  • Keywords
    area measurement; clock distribution networks; nanowires; area measurement; asynchronous nanowire crossbar system; clock distribution network; global clocking; latency measurement; logic block structures; null convention logic; Area measurement; Clocks; Delay; Logic programming; Manufacturing; Optimization methods; Reconfigurable architectures; Reconfigurable logic; Robustness; Timing; Area/Latency measurement; Asynchronous computing; Nanowire crossbar; Null convention logic(NCL); Optimization; Reconfigurable logic;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    1091-5281
  • Print_ISBN
    978-1-4244-2832-8
  • Electronic_ISBN
    1091-5281
  • Type

    conf

  • DOI
    10.1109/IMTC.2010.5488108
  • Filename
    5488108