• DocumentCode
    2687547
  • Title

    Analog to digital converters for high temperature applications: The modeling approach issue

  • Author

    Baccar, Sahbi ; Qaisar, Saeed Mian ; Dallet, Dominique ; Lévi, Timothée ; Shitikov, Vladimir ; Barbara, François

  • Author_Institution
    CNRS, Lab. IMS-ENSEIRB, Talence, France
  • fYear
    2010
  • fDate
    3-6 May 2010
  • Firstpage
    550
  • Lastpage
    554
  • Abstract
    The analog to digital converter (ADC) is an essential part of measurement, communications and processing systems. ADC modeling is a rich trend in the ADC research areas. High temperature applications have witnessed a real growth in last years. The motivation of this article is to describe an appropriate choice of the ADC modeling approach for high temperature ranges. The context of high temperature electronics systems is briefly described here and allows us to understand the challenges of such modeling. Comparing most known techniques enables us to make a suitable modeling choice for high temperature. An appropriate method for modeling was presented.
  • Keywords
    analogue-digital conversion; high-temperature electronics; analog to digital converters; high temperature applications; modeling approach; Aerospace electronics; Aerospace industry; Analog-digital conversion; CMOS logic circuits; CMOS technology; Consumer electronics; Instruments; Internal combustion engines; Temperature distribution; Temperature sensors; ADC modeling; behavioral model; high temperature; mixed model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    1091-5281
  • Print_ISBN
    978-1-4244-2832-8
  • Electronic_ISBN
    1091-5281
  • Type

    conf

  • DOI
    10.1109/IMTC.2010.5488109
  • Filename
    5488109