DocumentCode
2687547
Title
Analog to digital converters for high temperature applications: The modeling approach issue
Author
Baccar, Sahbi ; Qaisar, Saeed Mian ; Dallet, Dominique ; Lévi, Timothée ; Shitikov, Vladimir ; Barbara, François
Author_Institution
CNRS, Lab. IMS-ENSEIRB, Talence, France
fYear
2010
fDate
3-6 May 2010
Firstpage
550
Lastpage
554
Abstract
The analog to digital converter (ADC) is an essential part of measurement, communications and processing systems. ADC modeling is a rich trend in the ADC research areas. High temperature applications have witnessed a real growth in last years. The motivation of this article is to describe an appropriate choice of the ADC modeling approach for high temperature ranges. The context of high temperature electronics systems is briefly described here and allows us to understand the challenges of such modeling. Comparing most known techniques enables us to make a suitable modeling choice for high temperature. An appropriate method for modeling was presented.
Keywords
analogue-digital conversion; high-temperature electronics; analog to digital converters; high temperature applications; modeling approach; Aerospace electronics; Aerospace industry; Analog-digital conversion; CMOS logic circuits; CMOS technology; Consumer electronics; Instruments; Internal combustion engines; Temperature distribution; Temperature sensors; ADC modeling; behavioral model; high temperature; mixed model;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE
Conference_Location
Austin, TX
ISSN
1091-5281
Print_ISBN
978-1-4244-2832-8
Electronic_ISBN
1091-5281
Type
conf
DOI
10.1109/IMTC.2010.5488109
Filename
5488109
Link To Document