Characterization and optimization of defects and defect tolerance for not-practically-testable circuits

The aim of the work is ultimately to establish a theoretical foundation for economical decision making on whether to test; how far to test; whether testing is feasible; and, otherwise, whether there is an alternative to defect tolerance with little or no testing. In this work, a new defect tolerance for the circuits and systems under the circumstances where little or no testing is allowed or feasible, is to be investigated. New methodologies for the design for defect tolerance will be presented and theoretically validated.