• DocumentCode
    2687662
  • Title

    On measuring the transparentability of cores in core-based ICs

  • Author

    Hong Wang ; Shiyuan Yang

  • Volume
    2
  • fYear
    2003
  • fDate
    21-24 Oct. 2003
  • Firstpage
    1145
  • Abstract
    Core-based IC design introduces more test challenges, especially in an open design environment. Macro test is an effective test strategy. However, the measurement of plenitude of transfers and effects which crucially affects the test protocol expansion remains a problem, and the high-level abstraction of description of cores contributes to this measurement difficulty. In this paper, transparentability is defined to represent the ability that a core can be treated as transparent to the core-under-test in test phase. Then some measuring factors of it independent of circuit structure are proposed. They are further classified into transparentability level 1 and level 2. The two levels of transparentability may be used as a common measurement, even if the core is described in RT level or higher abstraction level, and they are not limited to be used in macro test. The differences between transparentability and conventional testability are also discussed.
  • Keywords
    design for testability; integrated circuit design; integrated circuit testing; RT level; circuit structure; core transparentability; core-based IC design; core-under-test; high-level abstraction; macro test; open design environment; test protocol expansion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC, 2003. Proceedings. 5th International Conference on
  • ISSN
    1523-553X
  • Print_ISBN
    0-7803-7889-X
  • Type

    conf

  • DOI
    10.1109/ICASIC.2003.1277416
  • Filename
    1277416