Title :
Dynamic Diode Mixer Damage Measurements
Author :
Garver, R.V. ; Fazi, C. ; Bruns, H.
Abstract :
An experiemntal setup has been developed which permits the progressive degradation of a mixer to be observed while it is being exposed to high-power-microwave pulses at a low repetition rate.
Keywords :
Annealing; Displays; Laboratories; Light emitting diodes; Power system protection; Pulse measurements; Semiconductor diodes; Temperature; Testing; Thermal degradation;
Conference_Titel :
Microwave Symposium Digest, 1985 IEEE MTT-S International
Conference_Location :
St. Louis, MO, USA
DOI :
10.1109/MWSYM.1985.1132031
