DocumentCode
2687666
Title
Dynamic Diode Mixer Damage Measurements
Author
Garver, R.V. ; Fazi, C. ; Bruns, H.
fYear
1985
fDate
4-6 June 1985
Firstpage
535
Lastpage
536
Abstract
An experiemntal setup has been developed which permits the progressive degradation of a mixer to be observed while it is being exposed to high-power-microwave pulses at a low repetition rate.
Keywords
Annealing; Displays; Laboratories; Light emitting diodes; Power system protection; Pulse measurements; Semiconductor diodes; Temperature; Testing; Thermal degradation;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1985 IEEE MTT-S International
Conference_Location
St. Louis, MO, USA
ISSN
0149-645X
Type
conf
DOI
10.1109/MWSYM.1985.1132031
Filename
1132031
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