DocumentCode :
268768
Title :
IEEE International Integrated Reliability Workshop (IIRW)
Volume :
13
Issue :
3
fYear :
2013
fDate :
Sept. 2013
Firstpage :
423
Lastpage :
423
fLanguage :
English
Journal_Title :
Device and Materials Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
1530-4388
Type :
jour
DOI :
10.1109/TDMR.2013.2279328
Filename :
6588395
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=268768
