• DocumentCode
    2687738
  • Title

    DFT for improving the testability of parametric resistor faults

  • Author

    Wong, M.W.T.

  • Author_Institution
    Dept. of Electron. & Inf. Eng., Hong Kong Polytech. Univ., China
  • Volume
    2
  • fYear
    2003
  • fDate
    21-24 Oct. 2003
  • Firstpage
    1163
  • Abstract
    This paper describes a test approach for a strain gauge measurement circuit. The test method is based on the analysis of equivalent faults extracted before the test solution conceptualization stage. Experimental results obtained demonstrate the effectiveness and validity of the approach.
  • Keywords
    design for testability; fault diagnosis; resistors; strain gauges; DFT; equivalent faults; parametric resistor faults; strain gauge measurement circuit; test method; test solution conceptualization stage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC, 2003. Proceedings. 5th International Conference on
  • ISSN
    1523-553X
  • Print_ISBN
    0-7803-7889-X
  • Type

    conf

  • DOI
    10.1109/ICASIC.2003.1277420
  • Filename
    1277420
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2687738