• DocumentCode
    2687759
  • Title

    Testing for reliability-relevant or misleading?

  • Author

    Hunter, John

  • Author_Institution
    Adv. Assembly Technol., Adv. Micro Devices Inc., Sunnyvale, CA, USA
  • fYear
    1998
  • fDate
    8-10 Dec 1998
  • Firstpage
    10
  • Lastpage
    11
  • Abstract
    Summary form only given. The semiconductor content of electronic systems has increased strongly in the last three decades. It is expected that the performance and functionality of these semiconductors will continue to increase, according to some version of Moore´s Law, while costs (as measured per gate or per bit) will continue to fall. What has also become expected, although it is not often stated explicitly, is that electronics reliability must continue to improve. Manufacturers of electronic systems will have to provide this improved reliability or risk losing their customers to competition; and given the rapidly increasing semiconductor content in these systems, it is natural to anticipate that the semiconductor suppliers should be playing a significant role in this endeavour. This article discusses what this role should be, and how it should be defined
  • Keywords
    integrated circuit manufacture; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; Moore´s Law; electronic system manufacturers; electronic systems; electronics reliability; functionality; market competition; reliability; reliability testing; semiconductor content; semiconductor costs; semiconductor performance; semiconductor suppliers; Assembly; Consumer electronics; Failure analysis; Inorganic materials; Materials reliability; Organic materials; Packaging; Semiconductor device manufacture; Semiconductor device reliability; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference, 1998. Proceedings of 2nd
  • Print_ISBN
    0-7803-5141-X
  • Type

    conf

  • DOI
    10.1109/EPTC.1998.755970
  • Filename
    755970