Title :
Approaches of error diagnosis and correction in combinational circuits
Author_Institution :
Inst. of VLSI Design, Zhejiang Univ., Hangzhou, China
Abstract :
With the increase in the complexity of VLSI circuit design and corresponding increase in the number of logic gates on a chip, logic design errors can frequently occur. In this paper we review two representative approaches for error diagnosis and correction. They are simulation-based approach and symbolic approach. The basic ideas are presented. The two approaches are compared and the advantages and disadvantages are presented.
Keywords :
VLSI; combinational circuits; error correction; fault simulation; integrated circuit design; logic design; logic testing; EDAC; VLSI circuit design; combinational circuits; error correction; error diagnosis; logic design errors; logic gates; simulation-based approach; symbolic approach;
Conference_Titel :
ASIC, 2003. Proceedings. 5th International Conference on
Print_ISBN :
0-7803-7889-X
DOI :
10.1109/ICASIC.2003.1277422
