Title :
Discarding outliers using a nonlinear resistive network
Author :
Harris, John G. ; Liu, Shih-Chii ; Mathur, Bimal
Author_Institution :
Comput. & Neural Syst. Program, California Inst. of Technol., Pasadena, CA, USA
Abstract :
The authors describe an algorithm for discarding outliers in noisy and possibly sparse sensor data. The authors demonstrate a network that incorporates robustness in its computation and the network settles to its final solution in a few time constants. The work is a modification of a resistive network which provides for detection and removal of outliers in image segmentation. A nonlinear resistive network is used to isolate an input point from the rest of the network when the input point differs significantly from the neighborhood average. The resistive network outlier algorithm has a simple elegant embodiment in analog real-time VLSI hardware. The authors demonstrate the algorithm with simulations on a laser radar image
Keywords :
VLSI; analogue circuits; computerised picture processing; neural nets; optical radar; real-time systems; analog real-time VLSI hardware; image segmentation; laser radar image; noisy data; nonlinear resistive network; outlier discarding; outlier removal; resistive network; resistive network outlier algorithm; robustness; sparse sensor data; time constants; Biomembranes; Gaussian noise; Laser noise; Laser radar; Least squares methods; Millimeter wave radar; Noise robustness; Radar imaging; Sensor arrays; Surface reconstruction;
Conference_Titel :
Neural Networks, 1991., IJCNN-91-Seattle International Joint Conference on
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-0164-1
DOI :
10.1109/IJCNN.1991.155230