• DocumentCode
    2688054
  • Title

    Electrochemical corrosion behaviors of ITO films at anodic and cathodic polarization in sodium hydroxide solution

  • Author

    Hao, Wang ; Cheng, Zhong ; Jin, Li ; Yiming, Jiang

  • Author_Institution
    Dept. of Mater. Sci., Fudan Univ., Shanghai
  • fYear
    2008
  • fDate
    28-31 July 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The electrochemical corrosion behaviors of indium tin oxides (ITO) films were investigated by electrochemical methods in sodium hydroxide solutions. Cyclic voltammetries of ITO films at both anodic and cathodic polarization were carried out. Transmittance spectra, scanning electron microscopy (SEM) and X-ray diffraction (XRD) analysis were used for characterization of the optical transmittance, the corrosion morphology and identification of corrosion product. ITO film remained stable after anodic polarization. In contrast, serious corrosion occurred at cathodic polarization (approximately -1.3 V vs. saturated calomel electrode (SCE)). Meanwhile, optical transmittance decreased greatly. The results showed that some of Sn4+ in the ITO is reduced to the lower metal state in the form of hydroxides of Sn, which attached to the surface.
  • Keywords
    X-ray diffraction; anodes; cathodes; corrosion; corrosion testing; electrochemical electrodes; indium compounds; polarisation; reduction (chemical); scanning electron microscopy; semiconductor thin films; sodium compounds; voltammetry (chemical analysis); ITO; NaOH; SEM; X-ray diffraction analysis; XRD analysis; anodic polarization; cathodic polarization; corrosion morphology; cyclic voltammetries; electrochemical corrosion behaviors; electrochemical methods; indium tin oxides films; optical transmittance; optical transmittance characterization; saturated calomel electrode; scanning electron microscopy; sodium hydroxide solution; transmittance spectra; Corrosion; Electron optics; Indium tin oxide; Optical diffraction; Optical films; Optical microscopy; Optical polarization; Optical saturation; Scanning electron microscopy; X-ray diffraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology & High Density Packaging, 2008. ICEPT-HDP 2008. International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-2739-0
  • Electronic_ISBN
    978-1-4244-2740-6
  • Type

    conf

  • DOI
    10.1109/ICEPT.2008.4607097
  • Filename
    4607097