Title :
Via design optimisation for high speed device packaging
Author :
Low, Hong-Guan ; Iyer, Mahadevan K. ; Ooi, Ban-Leong ; Leong, M.-S.
Author_Institution :
Dept. of Electr. Eng., Nat. Univ. of Singapore, Singapore
Abstract :
This paper presents the design and electrical characterization of a circular via hole applied to single and multi chip modules. A typical strip line-to-strip line configuration incorporating the via hole is designed, modelled and simulated using the Maxwell Strata mixed potential integration equation (MPIE)-based field solver. This configuration is modelled on a practical user-defined transmission line structure consisting of conductors of finite conductivity. We investigated the effects of three critical parameters, via hole diameter, ground plane opening and via height, on the frequency response. It is found that the via hole diameter should be minimized while the other two parameters should be maximized for better performance. This paper thus provides useful optimization criteria for circular vias, given the practical limitations of manufacturing technologies
Keywords :
circuit optimisation; circuit simulation; electric field integral equations; frequency response; high-speed integrated circuits; integrated circuit design; integrated circuit interconnections; integrated circuit modelling; integrated circuit packaging; multichip modules; software tools; strip line circuits; transmission line theory; Maxwell Strata mixed potential integration equation-based field solver; circular via hole; circular vias; critical parameters; electrical characterization; finite conductivity conductors; frequency response; ground plane opening; ground plane opening maximization; high speed device packaging; manufacturing technologies; multi chip modules; optimization criteria; single chip modules; strip line-to-strip line configuration; user-defined transmission line structure; via design optimisation; via height; via height maximization; via hole; via hole design; via hole diameter; via hole diameter minimization; via hole modelling; via hole simulation; Design optimization; Dielectric substrates; Finite difference methods; Integrated circuit interconnections; Metallization; Packaging; Slabs; Stripline; Strips; Time domain analysis;
Conference_Titel :
Electronics Packaging Technology Conference, 1998. Proceedings of 2nd
Print_ISBN :
0-7803-5141-X
DOI :
10.1109/EPTC.1998.755988