• DocumentCode
    2688082
  • Title

    Physics-based bipolar transistor model for low-temperature circuit simulation

  • Author

    Liou, J.J. ; Yuan, J.S.

  • fYear
    1989
  • fDate
    15-18 May 1989
  • Abstract
    A comprehensive bipolar transistor model based on the Gummel-Poon model for low-temperature circuit simulation is presented. Low-temperature physical properties such as doping-dependent dielectric permittivity, temperature-dependent free-carrier mobility and intrinsic carrier density, and deionization of impurity dopants are included in the model. Consequently, the model does not require temperature-fitting parameters as does the Gummel-Poon model. Comparisons of the present model with the Gummel-Poon model, with experimental data, and with PISCES two-dimensional device simulation are included
  • Keywords
    bipolar transistors; carrier density; carrier mobility; permittivity; semiconductor device models; Gummel-Poon model; PISCES two-dimensional device simulation; bipolar transistor model; deionization; doping-dependent dielectric permittivity; impurity dopants; intrinsic carrier density; low-temperature circuit simulation; temperature-dependent free-carrier mobility; temperature-fitting parameters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 1989., Proceedings of the IEEE 1989
  • Conference_Location
    San Diego, CA, USA
  • Type

    conf

  • DOI
    10.1109/CICC.1989.56719
  • Filename
    5726186