Title :
Effects of Ni addition on microstructure and the shear strength of Sn-3.0Ag-0.5Cu/Cu solders joints
Author :
Wang, Lifeng ; Shen, Xuwei ; Sun, Fenglian ; Liu, Yang
Author_Institution :
Harbin Univ. of Sci. & Technol., Harbin
Abstract :
The effects of the fourth Ni element on microstructure and monotonic shear strength of Sn-3.0Ag-0.5Cu lead-free solder were investigated. The addition of the Ni element makes the new (CuxNi1-x)6Sn5 phase, which improves the solder microstructure. The results indicate that the addition of Ni element increases the shear strength of solder joint. When the content of Ni is 0.10 wt.%, the shear strength of solder joint is the highest by 40.28 MPa which is 18% higher than that of Sn-3.0Ag-0.5Cu lead-free solder. The fracture morphology shows that the addition of Ni promotes grain refinement which leads to the increase of shear strength. The shear strength of the solder joints decrease continuously. The fracture microstructure became coarse-rained with the increase of thermal aging time. Dimples and voids appears in the solder joints which lead to the decrease of the shear strength.
Keywords :
ageing; copper alloys; crystal microstructure; nickel alloys; shear strength; silver alloys; solders; thermal analysis; tin alloys; (CuxNi1-x)Sn5; SnAgCu-Cu; fracture microstructure; fracture morphology; lead-free solder; monotonic shear strength; pressure 40.28 MPa; shear strength; thermal aging time; Abrasives; Aging; Environmentally friendly manufacturing techniques; Lead; Microstructure; Morphology; Nickel alloys; Scanning electron microscopy; Soldering; Thermal resistance;
Conference_Titel :
Electronic Packaging Technology & High Density Packaging, 2008. ICEPT-HDP 2008. International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-2739-0
Electronic_ISBN :
978-1-4244-2740-6
DOI :
10.1109/ICEPT.2008.4607099