• DocumentCode
    2688085
  • Title

    Effects of Ni addition on microstructure and the shear strength of Sn-3.0Ag-0.5Cu/Cu solders joints

  • Author

    Wang, Lifeng ; Shen, Xuwei ; Sun, Fenglian ; Liu, Yang

  • Author_Institution
    Harbin Univ. of Sci. & Technol., Harbin
  • fYear
    2008
  • fDate
    28-31 July 2008
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    The effects of the fourth Ni element on microstructure and monotonic shear strength of Sn-3.0Ag-0.5Cu lead-free solder were investigated. The addition of the Ni element makes the new (CuxNi1-x)6Sn5 phase, which improves the solder microstructure. The results indicate that the addition of Ni element increases the shear strength of solder joint. When the content of Ni is 0.10 wt.%, the shear strength of solder joint is the highest by 40.28 MPa which is 18% higher than that of Sn-3.0Ag-0.5Cu lead-free solder. The fracture morphology shows that the addition of Ni promotes grain refinement which leads to the increase of shear strength. The shear strength of the solder joints decrease continuously. The fracture microstructure became coarse-rained with the increase of thermal aging time. Dimples and voids appears in the solder joints which lead to the decrease of the shear strength.
  • Keywords
    ageing; copper alloys; crystal microstructure; nickel alloys; shear strength; silver alloys; solders; thermal analysis; tin alloys; (CuxNi1-x)Sn5; SnAgCu-Cu; fracture microstructure; fracture morphology; lead-free solder; monotonic shear strength; pressure 40.28 MPa; shear strength; thermal aging time; Abrasives; Aging; Environmentally friendly manufacturing techniques; Lead; Microstructure; Morphology; Nickel alloys; Scanning electron microscopy; Soldering; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology & High Density Packaging, 2008. ICEPT-HDP 2008. International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-2739-0
  • Electronic_ISBN
    978-1-4244-2740-6
  • Type

    conf

  • DOI
    10.1109/ICEPT.2008.4607099
  • Filename
    4607099