DocumentCode
2688085
Title
Effects of Ni addition on microstructure and the shear strength of Sn-3.0Ag-0.5Cu/Cu solders joints
Author
Wang, Lifeng ; Shen, Xuwei ; Sun, Fenglian ; Liu, Yang
Author_Institution
Harbin Univ. of Sci. & Technol., Harbin
fYear
2008
fDate
28-31 July 2008
Firstpage
1
Lastpage
5
Abstract
The effects of the fourth Ni element on microstructure and monotonic shear strength of Sn-3.0Ag-0.5Cu lead-free solder were investigated. The addition of the Ni element makes the new (CuxNi1-x)6Sn5 phase, which improves the solder microstructure. The results indicate that the addition of Ni element increases the shear strength of solder joint. When the content of Ni is 0.10 wt.%, the shear strength of solder joint is the highest by 40.28 MPa which is 18% higher than that of Sn-3.0Ag-0.5Cu lead-free solder. The fracture morphology shows that the addition of Ni promotes grain refinement which leads to the increase of shear strength. The shear strength of the solder joints decrease continuously. The fracture microstructure became coarse-rained with the increase of thermal aging time. Dimples and voids appears in the solder joints which lead to the decrease of the shear strength.
Keywords
ageing; copper alloys; crystal microstructure; nickel alloys; shear strength; silver alloys; solders; thermal analysis; tin alloys; (CuxNi1-x)Sn5; SnAgCu-Cu; fracture microstructure; fracture morphology; lead-free solder; monotonic shear strength; pressure 40.28 MPa; shear strength; thermal aging time; Abrasives; Aging; Environmentally friendly manufacturing techniques; Lead; Microstructure; Morphology; Nickel alloys; Scanning electron microscopy; Soldering; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology & High Density Packaging, 2008. ICEPT-HDP 2008. International Conference on
Conference_Location
Shanghai
Print_ISBN
978-1-4244-2739-0
Electronic_ISBN
978-1-4244-2740-6
Type
conf
DOI
10.1109/ICEPT.2008.4607099
Filename
4607099
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