DocumentCode :
2688240
Title :
Boundary element analysis of delamination in IC packages
Author :
Tay, A.A.O. ; Lee, K.H. ; Lim, K.M.
Author_Institution :
Centre for IC Failure Analysis & Reliablity, Singapore Nat. Univ., Singapore
fYear :
1998
fDate :
8-10 Dec 1998
Firstpage :
153
Lastpage :
159
Abstract :
A crack tip at an interface between two materials has an order of singularity which is a function of the material properties. For accurate analysis, a special variable-order singular boundary element has been developed and used. The effect of defect size and location along the pad-encapsulant interface on interfacial delamination has been studied. It was found that the energy release rate or stress intensity factor increases with defect size as well as proximity to the pad corner. This implies that when a small delamination near a pad corner delaminates, the crack tip nearer the pad corner will propagate first. The analysis also shows that this delamination, once started, will continue until the crack tip reaches the pad corner. If the variation of interface toughness as a function of mode mixity is known, the delamination propagation behaviour can be determined. Depending on the shape of the curve describing the variation of interface toughness with mode mixity, the delamination growth can either be stable, catastrophic or initially unstable followed by stable growth
Keywords :
boundary-elements methods; cracks; delamination; encapsulation; integrated circuit modelling; integrated circuit packaging; interface structure; stress analysis; IC packages; boundary element analysis; catastrophic delamination growth; crack tip propagation; defect location; defect size; delamination; delamination propagation; energy release rate; initially unstable delamination growth; interface crack tip; interface toughness; interfacial delamination; material properties; mode mixity; pad corner delamination; pad corner proximity; pad-encapsulant interface; singularity; stable delamination growth; stress intensity factor; variable-order singular boundary element analysis; Delamination; Encapsulation; Failure analysis; Integrated circuit packaging; Material properties; Plastic integrated circuit packaging; Resins; Shape; Surface-mount technology; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference, 1998. Proceedings of 2nd
Print_ISBN :
0-7803-5141-X
Type :
conf
DOI :
10.1109/EPTC.1998.755995
Filename :
755995
Link To Document :
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