DocumentCode :
2688287
Title :
An Experimental Investigation of Microstrip Properties on Soft Substrates from 2 to 40 GHz
Author :
Romanofsky, R.R. ; Bhasin, K.B. ; Ponchak, G.E. ; Downey, A.M. ; Connolly, D.J.
fYear :
1985
fDate :
4-6 June 1985
Firstpage :
675
Lastpage :
678
Abstract :
Dispersion and loss characteristics of microstrip lines on 10 mil and 31 mil electrodeposited and electroless copper clad-Teflon substrates were experimentally obtained from 2-40 GHz. The roles of surface roughness and radiation in total loss are examined.
Keywords :
Dielectric losses; Dielectric substrates; Dispersion; Microstrip; Optical resonators; Permittivity; Resonance; Resonant frequency; Rough surfaces; Surface roughness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 1985 IEEE MTT-S International
Conference_Location :
St. Louis, MO, USA
ISSN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.1985.1132072
Filename :
1132072
Link To Document :
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