Title :
Modelling and Measurement of Microstrip Transmission Line Structures
Author :
Shepherd, P.R. ; Daly, P.
Abstract :
New techniques have been employed in both the modelling and measurement of microstrip transmission line structures. The modelling employs a dual potential approach using finite element analysis to derive exact bounds to the microstrip characteristics. The measurement uses an "on-chip" calibration method with microstrip calibration pieces.
Keywords :
Calibration; Capacitance; Dielectric constant; Finite element methods; Gallium arsenide; Impedance; Microstrip; Transmission line matrix methods; Transmission line measurements; Transmission line theory;
Conference_Titel :
Microwave Symposium Digest, 1985 IEEE MTT-S International
Conference_Location :
St. Louis, MO, USA
DOI :
10.1109/MWSYM.1985.1132073
