DocumentCode
2688456
Title
Thermal transient testing of packages without a tester
Author
Székely, Vladimir ; Rencz, Márta ; Courtois, Bernard
Author_Institution
Dept. of Electron Devices, Budapest Tech. Univ., Hungary
fYear
1998
fDate
8-10 Dec 1998
Firstpage
236
Lastpage
239
Abstract
Thermal transient testing is an excellent method to measure the thermal properties of packages, to check die attach quality and to detect and localise physical defects in the heat removal path. The measured transient responses are also the basis for compact, dynamic thermal model generation. The measurement set-up for the thermal transient experiments is rather complex, including expensive dedicated equipment. The purpose of this paper is to present an alternative solution for thermal transient testing which eliminates the need for expensive hardware. A method for compact thermal model generation is also provided
Keywords
fault location; integrated circuit modelling; integrated circuit packaging; integrated circuit testing; microassembling; quality control; thermal analysis; transient analysis; transient response; die attach quality; dynamic thermal model generation; heat removal path; measurement set-up; package thermal properties; packages; physical defect detection; physical defect localisation; test hardware cost; tester; thermal model generation; thermal transient; thermal transient testing; transient responses; Area measurement; Circuit testing; Hardware; Packaging machines; Semiconductor device measurement; Semiconductor device packaging; Software measurement; Software testing; Temperature sensors; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Packaging Technology Conference, 1998. Proceedings of 2nd
Print_ISBN
0-7803-5141-X
Type
conf
DOI
10.1109/EPTC.1998.756008
Filename
756008
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