• DocumentCode
    2688456
  • Title

    Thermal transient testing of packages without a tester

  • Author

    Székely, Vladimir ; Rencz, Márta ; Courtois, Bernard

  • Author_Institution
    Dept. of Electron Devices, Budapest Tech. Univ., Hungary
  • fYear
    1998
  • fDate
    8-10 Dec 1998
  • Firstpage
    236
  • Lastpage
    239
  • Abstract
    Thermal transient testing is an excellent method to measure the thermal properties of packages, to check die attach quality and to detect and localise physical defects in the heat removal path. The measured transient responses are also the basis for compact, dynamic thermal model generation. The measurement set-up for the thermal transient experiments is rather complex, including expensive dedicated equipment. The purpose of this paper is to present an alternative solution for thermal transient testing which eliminates the need for expensive hardware. A method for compact thermal model generation is also provided
  • Keywords
    fault location; integrated circuit modelling; integrated circuit packaging; integrated circuit testing; microassembling; quality control; thermal analysis; transient analysis; transient response; die attach quality; dynamic thermal model generation; heat removal path; measurement set-up; package thermal properties; packages; physical defect detection; physical defect localisation; test hardware cost; tester; thermal model generation; thermal transient; thermal transient testing; transient responses; Area measurement; Circuit testing; Hardware; Packaging machines; Semiconductor device measurement; Semiconductor device packaging; Software measurement; Software testing; Temperature sensors; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference, 1998. Proceedings of 2nd
  • Print_ISBN
    0-7803-5141-X
  • Type

    conf

  • DOI
    10.1109/EPTC.1998.756008
  • Filename
    756008