Title :
A novel built-in CMOS sensor for on-line thermal monitoring of VLSI circuits
Author :
Zhang Sheng ; Zhou Runde
Abstract :
Built-in temperature sensors increase the system reliability by predicting eventual faults caused by excessive chip temperatures. In this paper, a novel temperature sensor is presented, developed by the authors especially for the purpose of thermal monitoring of VLSI chips. This proposed sensor require very small silicon area and power consumption and the accuracy is in the order of 0.8°C.
Keywords :
CMOS integrated circuits; VLSI; integrated circuit reliability; integrated circuit testing; monitoring; temperature sensors; 0.8 C; VLSI circuits; built-in CMOS sensor; excessive chip temperatures; on-line thermal monitoring; power consumption; system reliability; temperature sensors;
Conference_Titel :
ASIC, 2003. Proceedings. 5th International Conference on
Print_ISBN :
0-7803-7889-X
DOI :
10.1109/ICASIC.2003.1277466
