DocumentCode
2688468
Title
Mechanical reliability estimation for μBGA solder joints based on heating factor Qη
Author
Bo, Tao ; Zhouping, Yin ; Han, Ding ; Yiping, Wu
Author_Institution
Nat. Key Lab. of Digital Equip. & Technol., Huazhong Univ. of Sci. & Technol., Wuhan
fYear
2008
fDate
28-31 July 2008
Firstpage
1
Lastpage
4
Abstract
A novel method of mechanical reliability analysis on vibration fatigue failure of muBGA solder joints, based on the heating factor Qeta, is introduced. Firstly, a two-parameter weibull distribution is used to model the collected data of vibration fatigue lifetime for different Qeta. After that, two explicit functions are deduced in a unified mathematic expression form, which give an intuitionistic description of the MTTF and reliability of solder joints against induced variable Qeta, thus revealing definitely the effect of Qeta on the mechanical fatigue lifetime of solder joints suffering from cyclic vibration loading. Numerical analysis and calculation are performed. The results show that the solder joints reflowed at Qeta near 500 have higher reliable, and those reflowed farther away this optimal process parameter have less reliability.
Keywords
Weibull distribution; ball grid arrays; fatigue testing; reliability; solders; Weibull distribution; ball grid arrays; cyclic vibration loading; heating factor; mechanical fatigue lifetime; mechanical reliability estimation; solder joints; vibration fatigue failure; Assembly; Electronics packaging; Failure analysis; Fatigue; Heating; Scanning electron microscopy; Soldering; Temperature measurement; Testing; Vibrations; Heating Factor; Mechanical Fatigue Failure; Reflow Optimization; Reliability Estimation;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology & High Density Packaging, 2008. ICEPT-HDP 2008. International Conference on
Conference_Location
Shanghai
Print_ISBN
978-1-4244-2739-0
Electronic_ISBN
978-1-4244-2740-6
Type
conf
DOI
10.1109/ICEPT.2008.4607120
Filename
4607120
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