• DocumentCode
    2688633
  • Title

    High-speed A/D-D/A Conversion System with flexible testing capabilities

  • Author

    Vital, João C. ; Franca, José E.

  • Author_Institution
    Integrated Circuits and Systems Group
  • fYear
    1993
  • fDate
    3-6 Jan 1993
  • Firstpage
    357
  • Lastpage
    362
  • Keywords
    Analog-digital conversion; Built-in self-test; CMOS technology; Circuit simulation; Circuit testing; Computer architecture; Design for testability; Integrated circuit testing; Recycling; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 1993. Proceedings. The Sixth International Conference on
  • ISSN
    1063-9667
  • Print_ISBN
    0-8186-3180-5
  • Type

    conf

  • DOI
    10.1109/ICVD.1993.669710
  • Filename
    669710
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2688633