• DocumentCode
    2688703
  • Title

    Microstructural evolution of low temperature solders in solder joints on a flexible substrate

  • Author

    Muralidharan, G. ; Tsang, C.F. ; Corpuz, Victor G. ; Pooh, Peter

  • Author_Institution
    Inst. of Microelectron., Singapore
  • fYear
    1998
  • fDate
    8-10 Dec 1998
  • Firstpage
    302
  • Lastpage
    307
  • Abstract
    Surface mount technology is widely practiced in present day electronic component assembly. Low temperature solders are finding increasing applications, primarily when polymeric materials are involved in the assembly process. Although there is a significant amount of data on conventional Pb-Sn solders reflowed at temperatures above 200°C, information on the behaviour of other solders is extremely limited. Hence, it is necessary to develop an understanding of the structure-property relationship, both after reflow and after long term use, in these alternate solders. The solder microstructure in an SMT joint and the reflow characteristics are influenced by a variety of factors, including solder composition, reflow parameters such as temperature and dwell time, other process variables, subsequent temperature exposure, etc. In this study, two different solders, Pb-Sn-Bi solder and Pb-Sn-Ag solder, have been used to surface mount various components on a polyester substrate using various process conditions. The solder joint microstructures have been examined using cross-sectional scanning electron microscopy. The effects of some of the process variables on the solder microstructure are outlined. Differences between the behaviour of the solders are also highlighted. The solder microstructure is discussed on the basis of the reflow profiles and the flux used
  • Keywords
    assembling; crystal microstructure; printed circuit manufacture; printed circuit testing; reflow soldering; scanning electron microscopy; surface mount technology; 200 C; Pb-Sn solder reflow; Pb-Sn-Ag solder; Pb-Sn-Bi solder; PbSnAg; PbSnBi; SMT joint; SnPb; assembly process; cross-sectional scanning electron microscopy; electronic component assembly; flexible substrate; long term use; low temperature solders; microstructural evolution; polyester substrate; polymeric materials; process conditions; process variables; reflow characteristics; reflow dwell time; reflow profile; reflow temperature; solder composition; solder flux; solder joint microstructures; solder joint structure-property relationship; solder joints; solder microstructure; surface mount technology; surface mounting; temperature exposure; Assembly; Capacitors; Conductive films; Grain size; Intermetallic; Microstructure; Soldering; Solid state circuits; Substrates; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference, 1998. Proceedings of 2nd
  • Print_ISBN
    0-7803-5141-X
  • Type

    conf

  • DOI
    10.1109/EPTC.1998.756020
  • Filename
    756020